| 標題 |
Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland / Maksymilian Pluta, editor ; Mariusz Szyjer, Ewa Powichrowska, coeditors ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland). |
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