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作者 Schafft, Harry A., ed.

標題 NBS/FDA Workshop, Reliability Technology for Cardiac Pacemakers / Harry A. Schafft, editor ; Electronic Technology Division.

出版資料 Washington : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.

複本

說明 vi, 42, [1] p. ; 27 cm.
系列 Semiconductor measurement technology
NBS special publication ; 400-28
United States. National Bureau of Standards. Special publication ; 400-28.
Notes CODEN: XNBSAV.
Activity supported in cooperation with the Food and Drug Administration, Bureau of Medical Devices & Diagnostic Products.
Item 247.
S/N 003-003-01628-4.
With: Bound With: Microelectronic test pattern NBS-3 for evaluating the resistivity-dopant density relationship of silicon /
主題 Cardiac pacemakers -- Reliability.
添加作者 Institute for Applied Technology (U.S.). Electronic Technology Division.
United States. Bureau of Medical Devices and Diagnostic Products.
NBS/FDA Workshop, Reliability Technology for Cardiac Pacemakers, Gaithersburg, Md (1975)
添加標題 Reliability technology for cardiac pacemakers.
政府出版物號碼 C 13.10:400-28