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SUBJECTS (1-4 之 4)
Probes (Electronic instruments)
1 Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics Christou, A. Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978. 1978 評級: 複本
2 Characterization of a high frequency probe assembly for integrated circuit measurement Jesch, Ramon L. [Washington] : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975. 1975 評級: 複本
3 A manual wafer probe station for an integrated circuit test system Carver, G. P. Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981. 1981 評級: 複本
4 A solid-inclusion borehole probe to determine three-dimensional stress changes at a point in a rock Nichols, Thomas C. Washington, U.S. Govt. Print. Off., 1968. 1968 評級: 複本
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