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Accurate linewidth measurements on integrated-circuit photomasks

Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980. 1980

Angular sensitivity of controlled implanted doping profiles

Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978. 1978

Comprehensive test pattern and approach for characterizing SOS technology

Ham, W. E. (William E.)
Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980 i.e. 1979. 1980

DISTRIB I : an impurity redistribution computer program

Gilsinn, David, 1943-
Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U. S. Govt. Print. Off., 1979. 1979

In-plane semiconductor lasers : from ultraviolet to midinfrared : 10-13 February 1997, San Jose, Cal

Bellingham, Wash., USA : SPIE, c1997. c1997

Laser scanning of active semiconductor devices--videotape script

Sawyer, David E.
Washington : Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt of Docs., U.S. Govt. Print. Off., 1976. 1976

Microelectronic processing laboratory at NBS

Leedy, T. F.
Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978. 1978

Microelectronic test patterns: an overview

Buehler, Martin G.
[Washington] National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] 1974. 1974

Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acousti

Harman, George G.
Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979. 1979

Parameterization of the planetary boundary layer in atmospheric general circulation models : a revie

Bhumralkar, Chandrakant M.
Santa Monica, CA : Rand, 1975. 1975

Rationale and motivation for ROSIE

Santa Monica, CA : Rand, 1981. 1981

The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon

Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981. 1981

Semiconductor measurement technology combined quarterly report, October 1, 1973, to March 31, 1974

[Washington] : The Bureau : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974. 1974

Semiconductor measurement technology quarterly report, July 1 to September 30, 1973.

Washington : National Bureau of Standards ; for sale by the Supt. of Docs., U.S. Govt. Print Off., 1974 1974

Semiconductor measurement technology : quarterly report, July 1 to September 30, 1974

Washington, D.C. : National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Office, 1975. 1975

Spreading resistance analysis for silicon layers with nonuniform resistivity

Dickey, David H.
Washington : Dept. of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979. 1979

Supplemental global climatic data, July : a report prepared for Defense Advanced Research Projects A

Schutz, C (Charles), 1921-
Santa Monica, Ca : Rand, 1974. 1974

A wafer chuck for use between -196 and 350C̊

Koyama, R. Y.
Washington, Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979. 1979