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题名 Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach, USA / Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

出版资料 Bellingham, Wash., USA : SPIE, c2002.

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