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题名 The Destructive bond pull test / John Albers, editor.

出版资料 [Washington] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.

复本

载体形态 vi, 44 p. : ill. ; 26 cm.
丛编 Semiconductor measurement technology
National Bureau of Standards special publication ; 400-18
NBS special publication ; 400-18.
Notes "Jointly supported by: the National Bureau of Standards, the Defense Nuclear Agency, and the Navy Strategic Systems Project Office."
With: Bound With: A BASIC program for calculating dopant density profiles from capacitance-voltage data / Richard L. Mattis and Martin G. Buehler.
Bibliography Includes bibliographical references.
主题 Aluminum wire -- Testing.
Aluminum wire -- Bonding.
Semiconductors -- Bonding.
其它责任者 Albers, John.
政府出版物号 C 13.10:400-18
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