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Modulation measurements for microwave mixers

Kenney, James M.
Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980. 1980

Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier

Kenney, James M.
Washington : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976. 1976

Time domain automatic network analyzer for measurement of RF and microwave components

Gans, William L.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975. 1975

Using six-port and eight-port junctions to measure active and passive circuit parameters

Hoer, Cletus A. (Cletus Anthony), 1933-
Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975. 1975