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United States. Defense Nuclear Agency.
1 Microelectronic test patterns: an overview Buehler, Martin G. [Washington] National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] 1974. 1974 Evaluation: Exemplaires
2 Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier Kenney, James M. Washington : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976. 1976 Evaluation: Exemplaires
3 Semiconductor measurement technology combined quarterly report, October 1, 1973, to March 31, 1974 [Washington] : The Bureau : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974. 1974 Evaluation: Exemplaires
4 Semiconductor measurement technology quarterly report, July 1 to September 30, 1973. Washington : National Bureau of Standards ; for sale by the Supt. of Docs., U.S. Govt. Print Off., 1974 1974 Evaluation: Exemplaires
5 Semiconductor measurement technology : quarterly report, July 1 to September 30, 1974 Washington, D.C. : National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Office, 1975. 1975 Evaluation: Exemplaires
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Microelectronic test patterns: an overview