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1
Imprimé
 

Power-aware computer systems : Second International Workshop, PACS 2002, Cambridge, MA, USA, Februar


PACS 2002 (2002 : Cambridge, Mass)
Berlin ; New York : Springer, c2003. c2003

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7895.P68 .P33 2002    AVAILABLE
2
Imprimé
 

Selected papers on statistical design of integrated circuits



New York : IEEE Press, 1987. 1987

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .S415 1987    AVAILABLE
3
Imprimé
 

ARPA/NBS workshop III : test patterns for integrated circuits


Schafft, Harry A.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976. 1976

Evaluation:

 

Exemplaires

4
Imprimé
 

A BASIC program for calculating dopant density profiles from capacitance-voltage data


Mattis, Richard L.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975. 1975

Evaluation:

 

Exemplaires

5
Imprimé
 

Optical and dimensional-measurement problems with photomasking in microelectronics


Jerke, John M.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975. 1975

Evaluation:

 

Exemplaires

6
Imprimé
 

Technology CAD : computer simulation of IC processes and devices


Dutton, Robert W.
Boston : Kluwer Academic Publishers, c1993. c1993

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .D88 1993    AVAILABLE
7
Imprimé
 

Proceedings of the Second IEEE Asia-Pacific Conference on ASICs : AP-ASIC 2000, Hotel Shilla Cheju,


IEEE Asia Pacific Conference on ASICs (2nd : 2000 : Cheji, Korea)
Piscataway, NJ : IEEE, 2000. 2000

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874.6 .I32 2000    AVAILABLE
8
Ress. Electronique
 

ACM transactions on design automation of electronic systems



New York, NY : ACM, c1996- c1996-

Evaluation:

Exemplaires

9
Imprimé
 

Integrated circuit metrology and process control : proceedings of a conference held 27-29 September



Bellingham, Wash : SPIE Optical Engineering Press, 1994. 1994

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7836 .I578 1994    AVAILABLE
10
Imprimé
 

Advanced VLSI fabrication



Scottsdale, Ariz : Integrated Circuit Engineering Corporation, c1995. c1995

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874.75 .A395 1995    AVAILABLE
11
Imprimé
 

Parallel algorithms for VLSI computer-aided design applications


Banerjee, Prithviraj.
Englewood Cliffs, N.J : Prentice-Hall, c1994. c1994

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874.75 .B36 1994    AVAILABLE
12
INCONNU
 

An artificial intelligence approach to VLSI design


Kowalski, Thaddeus J.
Boston : Kluwer Academic Publishers, c1985. c1985

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .K675 1985    AVAILABLE
13
Imprimé
 

Conference on integrated circuits : Congress Theatre, Eastbourne, Sussex, 2nd-4th May, 1967


Conference on Integrated Circuits (1967 : Eastbourne, East Sussex, England)
London : Institution of Electrical Engineers, [1967] 1967

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .C65 1967    AVAILABLE
14
Imprimé
 

Anatomy of a silicon compiler



Boston : Kluwer Academic Publishers, c1992. c1992

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .A59 1992    AVAILABLE
15
Imprimé
 

Prin︠t︡sipy i metodologi︠i︡a postroeni︠i︡a SAPR BIS


Kazennov, G. G, Gennadiĭ Georgievich.
Moskva : "Vyssha︠i︡a shkola", 1990. 1990

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .A94 1990 vol. 1    AVAILABLE
16
Imprimé
 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7872.M3 P46 2000    AVAILABLE
17
Ress. Electronique
 

Advanced packaging an IHS Group publication.



Libertyville, Ill., USA : IHS Pub. Group, c1992- c1992-

Evaluation:

Exemplaires

18
Imprimé
 

Federal statutory protection for mask works.


Library of Congress. Copyright Office.
[Washington, D.C.] (101 Independence Ave., SE, Washington 20559-6000) : [Library of Congress, Copyright Office], 1998. 1998

Evaluation:

Exemplaires

19
Imprimé
 

Federal statutory protection for mask works.


Library of Congress. Copyright Office.
[Washington, DC] (101 Independence Ave., SE, Washington 20559-6000) : U.S. Copyright Office, [2004] 2004

Evaluation:

Exemplaires

20
INCONNU
 

Linear circuits: discrete and integrated


Faber, Rodney B.
Columbus, Ohio : Merrill, [1974] 1974

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7871.2 .F33    AVAILABLE
21
Imprimé
 

Technical digest 1985 : Monterey, California, November 12-14, 1985


IEEE Gallium Arsenide Integrated Circuit Symposium (1985 : Monterey, Calif)
New York, NY (345 E. 47th St., New York 10017) : Institute of Electrical and Electronics Engineers, c1985. c1985

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .I323 1985    AVAILABLE
22
Imprimé
 

ARPA/NBS workshop II : hermeticity testing for integrated circuits : [synopses]


Schafft, Harry A.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs. U.S. Govt. Print. Off., 1974. 1974

Evaluation:

 

Exemplaires

23
Imprimé
 

Techniques for measuring the integrity of passivation overcoats on integrated circuits


Kern, Werner, 1925-
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977. 1977

Evaluation:

 

Exemplaires

24
Ress. Electronique
 

Analog integrated circuits and signal processing



Boston/U.S.A. : Kluwer Academic Publishers, 1991- 1991-

Evaluation:

Exemplaires

25
INCONNU
 

Power-transistor and TTL integrated-circuit applications



New York : McGraw-Hill, c1977. c1977

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7871.92 .P68    AVAILABLE
26
Imprimé
 

Optical integrated circuits


Nishihara, Hiroshi, 1937-
New York : McGraw-Hill Book Co, c1989. c1989

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TA1660 .N5713 1989    AVAILABLE
27
Imprimé
 

Functional photonic integrated circuits : 9-10 February 1995, San Jose, California



Bellingham, Wash., USA : SPIE, c1995. c1995

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TA1660 .F86 1995    AVAILABLE
28
INCONNU
 

Circuithèque d'électronique


Lilen, Henri.
Paris : Éditions Radio, 19.  

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .L47 1975    AVAILABLE
29
Imprimé
 

Fundamentals of analog circuits


Floyd, Thomas L.
Upper Saddle River, N.J : Prentice Hall, c2002. c2002

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .F5899 2002    AVAILABLE
30
INCONNU
 

Hochintegrierte digitale Schaltungen und ihre Anwendung


Eckhardt, Dietrich.
Berlin : Verlag Technik, c1978. c1978

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TJ212 .R43 Bd. 184    AVAILABLE
31
Imprimé
 

Introduction to I̳D̳D̳Q testing


Chakravarty, Sreejit.
Boston : Kluwer Academic Publishers, c1997. c1997

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7871.99.M44 C4 1997    AVAILABLE
32
Imprimé
 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .M4375 1996    AVAILABLE
33
Imprimé
 

The simulation of thermomechanically induced stress in plastic encapsulated IC packages


Kelly, Gerard, Dr.
Boston : Kluwer Academic Publishers, c1999. c1999

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .K413 1999    AVAILABLE
34
Imprimé
 

IEEE transactions on components, packaging, and manufacturing technology.



New York : Institute of Electrical and Electronics Engineers.  

Evaluation:

 

Exemplaires

35
Imprimé
 

Instructional design in the real world : a view from the trenches



Hershey, PA : Information Science Pub., c2004 [i.e. 2003] c2004

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Reserves  LB1028.38 .I562 2004    AVAILABLE
36
Imprimé
 

Metrology for submicrometer devices and circuits


Bullis, W. Murray, 1930-
Washington : Dept. of Commerce, Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980 1980

Evaluation:

 

Exemplaires

37
Imprimé
 

RF design guide : systems, circuits, and equations


Vizmuller, Peter, 1954-
Boston : Artech House, c1995. c1995

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK6560 .V58 1995    AVAILABLE
38
Imprimé
 

Characterization of a high frequency probe assembly for integrated circuit measurement


Jesch, Ramon L.
[Washington] : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975. 1975

Evaluation:

 

Exemplaires

39
Imprimé
 

ARPA/NBS workshop I: measurement problems in integrated circuit processing and assembly


Schafft, Harry A.
[Washington] U.S. National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] 1974. 1974

Evaluation:

 

Exemplaires

40
Imprimé
 

Accurate linewidth measurements on integrated-circuit photomasks



Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980. 1980

Evaluation:

 

Exemplaires

41
Imprimé
 

A manual wafer probe station for an integrated circuit test system


Carver, G. P.
Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981. 1981

Evaluation:

 

Exemplaires

42
Imprimé
 

Modulation measurements for microwave mixers


Kenney, James M.
Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980. 1980

Evaluation:

 

Exemplaires

43
Imprimé
 

An introduction to mixed-signal IC test and measurement


Burns, Mark, 1962-
New York : Oxford University Press, c2001. c2001

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .B825 2001    AVAILABLE
44
Imprimé
 

Semiconductor measurement technology quarterly report, July 1 to September 30, 1973.



Washington : National Bureau of Standards ; for sale by the Supt. of Docs., U.S. Govt. Print Off., 1974 1974

Evaluation:

 

Exemplaires

45
Imprimé
 

Living homes : Thomas J. Elpel's field guide to integrated design & construction


Elpel, Thomas J.
Pony, Mont. : HOPS Press, 2001. 2001

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Emeryville Public Adult Non-Fiction  690.837 ELP    AVAILABLE
46
Imprimé
 

High frequency and microwave circuit design


Nelson, Greg (Charles G)
Boca Raton, FL : CRC Press, 1999. 1999

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7876 .N46 1999    AVAILABLE
47
Imprimé
 

Digital logic simulation and CPLD programming with VHDL


Waterman, Steve.
Upper Saddle River, N.J : Prentice Hall, 2003. 2003

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7868.L6 W29 2003    AVAILABLE
48
INCONNU
 

The travails of an external evaluation design : the Southern Highlands integrated rural development


Walter, Michael A. H. B.
Boroko, Papua New Guinea (P.O. Box 5854, Boroko) : Institute of Applied Social and Economic Research, [1981] 1981

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Special Collections  HN932.Z9 C68 1981    AVAILABLE
49
INCONNU
 

Measurement, design, and analysis : an integrated approach


Pedhazur, Elazar J.
Hillsdale, N.J : Lawrence Erlbaum Associates, 1991. 1991

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Special Collections  H62 .P325 1991    AVAILABLE
50
INCONNU
 

Integrált áramkörös elektronika


Sipos, Gyula.
Budapest : Műszaki Könyvkiadó, 1977. 1977

Evaluation:

 

Exemplaires

Localisation Cote Statut
 Innovative University Durant Collection  TK7874 .S54    AVAILABLE
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